MHz X-ray microscopy as child term to X-ray microscopy

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MHz X-ray microscopy

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MHz X-ray microscopy was developed by Dr. Patrik Vagovic and team at the European XFEL (P. Vagovic, Optica 2019.). MHz microscopy utilizes the unique properties of the hard x-ray MHz XFEL source the European XFEL (EuXFEL) and explore its possibilities for ultra-fast x-ray microscopy with MHz sampling and single pulse exposure. With MHz Microscopy, the high intensity hard X-rays (> 18 keV) from EuXFEL can be used to reveal dynamics of stochastic processes with velocities up to several kilometers per second with sub-micron-scale resolutions with high sensitivity to projected densities. Further, different modalities of MHz X-ray full-filed imaging are under development under the MHz microscopy umbrella. This ultra-fast imaging method fall under the category of X-ray imaging or X-ray microscopy; however, the high frame rates and single shot image capabilities distinguishes it from general Xray imaging/microscopy. The MHz X-ray imaging capabilities are currently unique to EuXFEL but once updated LCLS-II and SHINE XFELs becomes fully operational, this method could be applied there as well. Currently, MHz X-ray microscopy is available to users of EuXFEL through standard user proposals at the SPB/SFX instrument.

References
Vagovič et al. "Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources." Optica 6.9 (2019).
Koliyadu, et al. "Development of Megahertz X-ray Microscopy at the European XFEL" submitted to JSR (2024).

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X-ray microscopy

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From a data-manager point of view: PaNET terms are implemented to the EuXFEL metadata catalogue myMdC - adding new terms for techniques already in use at our facility will improve the user experience and clarity/accuracy of proposal metadata.

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Contacts for the scientific discussion (if required):
Patrik Vagovic: [email protected]
Jayanath Koliyadu: [email protected]